Metrology Instruments
Home > Facilities > Metrology Instruments
 Alicona Infinite focus-Optical 3D measurement & inspection

- 
Non-contact, optical 3 dimensional, based on Focus-Variation
- 
Surface profile form and roughness measurement
- 
Surface topography Ra above 10-15 nm with a Lc of 2um, surface structure dependent
- 
Minimum vertical repeatability less than 0.12 um
- 
Best vertical resolution in the range of 10 to 410 nm
- 
Fully automated and programmable xyz stages
- 
Less than 400 um/sec scan speed
- 
5x, 20x, 50x and 100x objective
 
 
 
 
 
 
 
 
 
 
ZYGO NewViewTM 7300 Non-destructive 3D surface metrology tool

- 
Surface height measurement from less than 1nm to 20 mm
- 
Sub-nanometer resolution
- 
Less than 0.01 nm RMS repeatability
- 
Fully automated and programmable xyz stages
- 
Less than 135 um/sec scan speed
- 
10x and 50x objectives