Northwestern University Robert R. McCormick School of Engineering and Applied Science

Advanced Manufacturing Processes Laboratory

Metrology Instruments

Alicona Infinite focus-Optical 3D measurement & inspection

  • Non-contact, optical 3 dimensional, based on Focus-Variation
  • Surface profile form and roughness measurement
  • Surface topography Ra above 10-15 nm with a Lc of 2um, surface structure dependent
  • Minimum vertical repeatability less than 0.12 um
  • Best vertical resolution in the range of 10 to 410 nm
  • Fully automated and programmable xyz stages
  • Less than 400 um/sec scan speed
  • 5x, 20x, 50x and 100x objective










ZYGO NewViewTM 7300 Non-destructive 3D surface metrology tool

  • Surface height measurement from less than 1nm to 20 mm
  • Sub-nanometer resolution
  • Less than 0.01 nm RMS repeatability
  • Fully automated and programmable xyz stages
  • Less than 135 um/sec scan speed
  • 10x and 50x objectives