Metrology Instruments
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Alicona Infinite focus-Optical 3D measurement & inspection
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Non-contact, optical 3 dimensional, based on Focus-Variation
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Surface profile form and roughness measurement
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Surface topography Ra above 10-15 nm with a Lc of 2um, surface structure dependent
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Minimum vertical repeatability less than 0.12 um
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Best vertical resolution in the range of 10 to 410 nm
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Fully automated and programmable xyz stages
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Less than 400 um/sec scan speed
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5x, 20x, 50x and 100x objective
ZYGO NewViewTM 7300 Non-destructive 3D surface metrology tool
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Surface height measurement from less than 1nm to 20 mm
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Sub-nanometer resolution
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Less than 0.01 nm RMS repeatability
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Fully automated and programmable xyz stages
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Less than 135 um/sec scan speed
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10x and 50x objectives